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Scalable techniques for producing field-effect passivation in high-efficiency silicon solar cells

Abstract:
This paper presents techniques to tailor and optimize the field-effect passivation of silicon surfaces using the deposition and field-assisted migration of potassium ions. While field-effect passivation of this nature has previously been demonstrated using laboratory scale techniques, in this paper, it is shown how it can be realized using fast and scalable ion deposition and migration methods. Together, the deposition and migration processes are seen to produce excellent improvements to the surface passivation of oxidized 1-Ω·cm n-type float-zone silicon. Effective lifetimes as high as 2.1 ms are observed, in the best case yielding a surface recombination velocity as low as 3.3 cm/s with a corresponding surface dark saturation current density of 8.4 fA/cm2.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1109/JPHOTOV.2018.2872032

Authors

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Oxford college:
Trinity College
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Engineering Science
Role:
Author


Publisher:
Institute of Electrical and Electronics Engineers
Journal:
IEEE Journal of Photovoltaics More from this journal
Publication date:
2018-10-08
Acceptance date:
2018-09-21
DOI:
EISSN:
2156-3381
ISSN:
2156-3381


Keywords:
Pubs id:
pubs:921168
UUID:
uuid:16300ffd-a97e-4dab-b3d5-6a38dcd93624
Local pid:
pubs:921168
Source identifiers:
921168
Deposit date:
2018-09-25
ARK identifier:

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