Conference item

The effect of radiation damage on anomalous absorption in the TEM

Abstract:: In-situ electron irradiation of Si at 400keV was performed to determine the variation of two-beam absorption parameters by the method of Hashimoto. Corresponding theoretical sensitivity studies were performed to assess limitations of experimental errors. No significant variations in parameters were revealed. Possible reasons for this are discussed.

Publication status:: Published

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APA Style

Scruby, L., Titchmarsh, J., & Jenkins, M. (2004). The effect of radiation damage on anomalous absorption in the TEM. Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003), 179(179), 311–314.

MLA Style

Scruby, L, et al. “The Effect of Radiation Damage on Anomalous Absorption in the TEM.” Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003), vol. 179, no. 179, 2004, pp. 311–14.

Chicago Style

Scruby, L, J Titchmarsh, and M Jenkins. 2004. “The Effect of Radiation Damage on Anomalous Absorption in the TEM.” In Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003), 179:311–14.
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Authors

+ Scruby, L More by this author

Role:: Author

+ Titchmarsh, J More by this author

Role:: Author

+ Jenkins, M More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

Journal:: ELECTRON MICROSCOPY AND ANALYSIS 2003 More from this journal
Volume:: 179
Issue:: 179
Pages:: 311-314
Publication date:: 2004-01-01
Event title:: Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003)
ISSN:: 0951-3248
ISBN:: 0750309679

Pubs id:: pubs:24699
UUID:: uuid:14ea105a-0fcf-4b49-9acb-f4865b835db4
Local pid:: pubs:24699
Source identifiers:: 24699
Deposit date:: 2012-12-19
ARK identifier:: ark:/29072/ora_14ea105a0fcf4b499acbf4865b835db4

Terms of use

Copyright date:: 2004

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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