Test generation and fault localization for quantum circuits

Journal article

It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A fault table is created that includes probabilistic information. \"Probabilistic set covering\" and \"probabilistic adaptive trees\" that generalize those known in standard circuits, are next used.

Authors: Perkowski, J; Lukac, M

• Journal: ISMVL '05 Proceedings of the 35th International Symposium on Multiple−Valued Logic
• Pages: 62-68
• Publication date: 2005-01-01
• DOI: 10.1109/ISMVL.2005.46
• ISBN: 0769523366