Journal article icon

Journal article

Test generation and fault localization for quantum circuits

Abstract:

It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A fault table is created that inc...

Expand abstract

Actions


Access Document


Publisher copy:
10.1109/ISMVL.2005.46

Authors


J Biamonte M Perkowski More by this author
Journal:
ISMVL '05 Proceedings of the 35th International Symposium on Multiple−Valued Logic
Pages:
62-68
Publication date:
2005
DOI:
URN:
uuid:14389317-928b-4ec1-8d54-17b130871ecd
Local pid:
cs:4035
ISBN:
0-7695-2336-6

Terms of use


Metrics



If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP