Journal article
Quantum metrology with imperfect states and detectors
- Abstract:
-
Quantum enhancements of precision in metrology can be compromised by system imperfections. These may be mitigated by appropriate optimization of the input state to render it robust, at the expense of making the state difficult to prepare. In this paper, we identify the major sources of imperfection an optical sensor: input state preparation inefficiency, sensor losses, and detector inefficiency. The second of these has received much attention; we show that it is the least damaging to surpassi...
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- Publication status:
- Published
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Bibliographic Details
- Journal:
- Phys. Rev. A
- Volume:
- 83
- Issue:
- 6
- Pages:
- 063836
- Publication date:
- 2010-12-02
- DOI:
- EISSN:
-
1094-1622
- ISSN:
-
1050-2947
Item Description
- Keywords:
- Pubs id:
-
pubs:164274
- UUID:
-
uuid:13d289a8-20ae-4265-b9d6-0c5364aa90fd
- Local pid:
- pubs:164274
- Source identifiers:
-
164274
- Deposit date:
- 2012-12-19
Terms of use
- Copyright date:
- 2010
- Notes:
- Reference updated. Close to the published version. 7 pages, 5 figures
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