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Quantum metrology with imperfect states and detectors

Abstract:

Quantum enhancements of precision in metrology can be compromised by system imperfections. These may be mitigated by appropriate optimization of the input state to render it robust, at the expense of making the state difficult to prepare. In this paper, we identify the major sources of imperfection an optical sensor: input state preparation inefficiency, sensor losses, and detector inefficiency. The second of these has received much attention; we show that it is the least damaging to surpassi...

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Publication status:
Published

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Publisher copy:
10.1103/PhysRevA.83.063836

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Atomic & Laser Physics
Role:
Author
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Journal:
Phys. Rev. A
Volume:
83
Issue:
6
Pages:
063836
Publication date:
2010-12-02
DOI:
EISSN:
1094-1622
ISSN:
1050-2947
Source identifiers:
164274
Keywords:
Pubs id:
pubs:164274
UUID:
uuid:13d289a8-20ae-4265-b9d6-0c5364aa90fd
Local pid:
pubs:164274
Deposit date:
2012-12-19

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