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Inherent electron and hole trapping in amorphous phase-change memory materials: Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub>

Abstract:
While the amorphous state of a chalcogenide phase-change material is formed inside an electronic-memory device via Joule heating, caused by an applied voltage pulse, it is in the presence of excess field-induced electrons and holes. Here, hybrid density-functional-theory calculations for glassy Ge2Sb2Te5 demonstrate that extra electrons are trapped spontaneously, creating deep traps in the band gap. Hole self-trapping is also energetically favourable, producing states around midgap. The traps have a relatively low ionization energy, indicating that they can easily be thermally released. Near-linear triatomic Te-Ge/Sb-Te/Ge/Sb environments are the structural motifs where the extra electrons/holes are trapped inside the glass network, highlighting that the intrinsic axial bonds of octahedral-like sites in amorphous Ge2Sb2Te5 can serve as charge-trapping centres. Trapping of two electrons in a chain-like structure of connected triads results in breaking of some of these highly polarizable long bonds. These results establish the foundations of the origin of charge trapping in amorphous phase-change materials, and they may have important implications for our understanding of resistance drift in electronic-memory devices and of electronic-excitation-induced athermal melting.publishedVersionPeer reviewe
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1039/d2tc00486k
Publication website:
https://trepo.tuni.fi/bitstream/10024/140475/1/d2tc00486k.pdf

Authors

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Role:
Author
ORCID:
0000-0003-1291-817X
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Institution:
University of Oxford
Role:
Author
ORCID:
0000-0002-8202-8482
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Role:
Author
ORCID:
0000-0001-9037-7095


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Funder identifier:
10.13039/501100000266
Grant:
EP/L000202, EP/R029431
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Funder identifier:
10.13039/501100002341
Grant:
322832 (NANOIONICS)


Publisher:
Royal Society of Chemistry
Journal:
Journal of Materials Chemistry C Materials for optical and electronic devices More from this journal
Volume:
10
Issue:
17
Pages:
6744-6753
Publication date:
2022-05-05
DOI:
EISSN:
2050-7534
ISSN:
2050-7526


Language:
English
Keywords:
Pubs id:
1255334
Local pid:
pubs:1255334
Source identifiers:
W4225842725
Deposit date:
2026-04-23
ARK identifier:
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