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Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction

Abstract:
Using time-resolved x-ray diffraction ultafast lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures has been studied. This experimental technique uniquely allows us to observe fast energy transport deep into. the bulk of the material, coherent acoustic phonon dynamics, lattice anharmonicity, and vibrational transport across a buried interface.
Publication status:
Published

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Publisher copy:
10.1051/jp4:2001290

Authors

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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Atomic & Laser Physics
Role:
Author


Journal:
JOURNAL DE PHYSIQUE IV More from this journal
Volume:
11
Issue:
PR2
Pages:
473-477
Publication date:
2001-07-01
Event title:
7th International Conference on X-Ray Lasers
DOI:
ISSN:
1155-4339


Pubs id:
pubs:29312
UUID:
uuid:13355be6-ca4c-47d6-947d-3898da34dd3e
Local pid:
pubs:29312
Source identifiers:
29312
Deposit date:
2012-12-19
ARK identifier:

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