Conference item icon

Conference item

Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction

Abstract:
Using time-resolved x-ray diffraction ultafast lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures has been studied. This experimental technique uniquely allows us to observe fast energy transport deep into. the bulk of the material, coherent acoustic phonon dynamics, lattice anharmonicity, and vibrational transport across a buried interface.
Publication status:
Published

Actions


Access Document


Publisher copy:
10.1051/jp4:2001290

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Atomic & Laser Physics
Role:
Author
Expand authors...
Journal:
JOURNAL DE PHYSIQUE IV
Volume:
11
Issue:
PR2
Pages:
473-477
Publication date:
2001-07-01
Event title:
7th International Conference on X-Ray Lasers
DOI:
ISSN:
1155-4339
Source identifiers:
29312
Pubs id:
pubs:29312
UUID:
uuid:13355be6-ca4c-47d6-947d-3898da34dd3e
Local pid:
pubs:29312
Deposit date:
2012-12-19

Terms of use


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP