Conference item
Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction
- Abstract:
- Using time-resolved x-ray diffraction ultafast lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures has been studied. This experimental technique uniquely allows us to observe fast energy transport deep into. the bulk of the material, coherent acoustic phonon dynamics, lattice anharmonicity, and vibrational transport across a buried interface.
- Publication status:
- Published
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- Publisher copy:
- 10.1051/jp4:2001290
Authors
- Journal:
- JOURNAL DE PHYSIQUE IV More from this journal
- Volume:
- 11
- Issue:
- PR2
- Pages:
- 473-477
- Publication date:
- 2001-07-01
- Event title:
- 7th International Conference on X-Ray Lasers
- DOI:
- ISSN:
-
1155-4339
- Pubs id:
-
pubs:29312
- UUID:
-
uuid:13355be6-ca4c-47d6-947d-3898da34dd3e
- Local pid:
-
pubs:29312
- Source identifiers:
-
29312
- Deposit date:
-
2012-12-19
- ARK identifier:
Terms of use
- Copyright date:
- 2001
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