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Aberration corrected TEM: current status and future prospects

Publication status:
Published

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Volume:
126
Pages:
012034-012034
Host title:
EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007
Publication date:
2008-01-01
DOI:
EISSN:
1742-6596
ISSN:
1742-6588
Source identifiers:
9848
Pubs id:
pubs:9848
UUID:
uuid:1301f5b0-937e-4f88-a6e4-8ee943129ba9
Local pid:
pubs:9848
Deposit date:
2012-12-19

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