Conference item

Aberration corrected TEM: current status and future prospects

Publication status:: Published

Actions

Email

Email this record

Send the bibliographic details of this record to your email address.

Your Email
Please enter the email address that the record information will be sent to.

-
Your message (optional)
Please add any additional information to be included within the email.
Share
Cite

Cite this record

APA Style

Kirkland, A., Haigh, S., & Chang, L. (2008). Aberration corrected TEM: current status and future prospects. 126, 012034–012034.

MLA Style

Kirkland, A, et al. “Aberration Corrected TEM: Current Status and Future Prospects.” vol. 126, 2008, pp. 012034–34.

Chicago Style

Kirkland, A, S Haigh, and L Chang. 2008. “Aberration Corrected TEM: Current Status and Future Prospects.” 126: 012034–34.
Print

Access Document

Publisher copy:: 10.1088/1742-6596/126/1/012034

Authors

+ Kirkland, A More by this author

Role:: Author

+ Haigh, S More by this author

Role:: Author

+ Chang, L More by this author

Role:: Author

Host title:: EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007
Volume:: 126
Pages:: 012034-012034
Publication date:: 2008-01-01
DOI:: 10.1088/1742-6596/126/1/012034
EISSN:: 1742-6596
ISSN:: 1742-6588

Pubs id:: pubs:9848
UUID:: uuid:1301f5b0-937e-4f88-a6e4-8ee943129ba9
Local pid:: pubs:9848
Source identifiers:: 9848
Deposit date:: 2012-12-19
ARK identifier:: ark:/29072/ora_1301f5b0937e4f88a6e48ee943129ba9

Terms of use

Copyright date:: 2008

Licence:: Terms and Conditions of Use for Oxford University Research Archive

Views and Downloads

About views and downloads

If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP