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Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction

Publication status:: Published

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APA Style

Wilkinson, A., & IOP. (2011). Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction. 326, 012004–012004.

MLA Style

Wilkinson, A., and IOP. Assessment of Lattice Strain, Rotation and Dislocation Content Using Electron Back-Scatter Diffraction. 2011, pp. 012004–04.

Chicago Style

Wilkinson, A, and IOP. 2011. “Assessment of Lattice Strain, Rotation and Dislocation Content Using Electron Back-Scatter Diffraction.” In , 326:012004–.
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Publisher copy:: 10.1088/1742-6596/326/1/012004

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+ Wilkinson, A More by this author

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+ IOP More by this author

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Bibliographic Details

Host title:: 17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011
Volume:: 326
Pages:: 012004-012004
Publication date:: 2011-01-01
DOI:: 10.1088/1742-6596/326/1/012004
EISSN:: 1742-6596
ISSN:: 1742-6588

Item Description

Pubs id:: pubs:246079
UUID:: uuid:12ca9b06-2665-4516-b8d1-d29f8de7f19c
Local pid:: pubs:246079
Source identifiers:: 246079
Deposit date:: 2012-12-19

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Copyright date:: 2011

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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