Quantifying Influence of Beam Drift on Linear Retardance Measurement in Dual-Rotating Retarder Mueller Matrix Polarimetry

Journal article

Mueller matrix polarimetry is recently attracting more and more attention for its diagnostic potentials. However, for prevalently used division of time Mueller matrix polarimeter based on dual-rotating retarder scheme, beam drift induced by rotating polarizers and waveplates introduces spatial misalignment and pseudo-edge artifacts in imaging results, hindering following accurate microstructural features characterization. In this paper, we quantitatively analyze the beam drift phenomenon in dual-rotating retarder Mueller matrix microscopy and its impact on linear retardance measurement, which is frequently used to reflect tissue fiber arrangement. It is demonstrated that polarizer rotation induces larger beam drift than waveplate rotation due to surface non-uniformity and stress deformation. Furthermore, for waveplates rotated constantly in dual-rotating retarder scheme, their tilt within polarization state analyzer can result in more drift and throughput loss than those within polarization state generator. Finally, phantom and tissue experiments confirm that beam drift, rather than inherent optical path changes, dominates the systematic overestimation of linear retardance in boundary image regions. The findings highlight beam drift as a dominant error source for quantifying linear retardance, necessitating careful optical design alignment and a reliable registration algorithm to obtain highly accurate polarization data for training machine learning models of pathological diagnosis using Mueller matrix microscopy.

Authors: Deng, K; Zeng, N; Deng, L; Liu, S; Ma, H

• Publication status: Published
• Peer review status: Peer reviewed
• Publisher: MDPI
• Journal: Photonics
• Volume: 12
• Issue: 9
• Article number: 868
• Publication date: 2025-08-28
• Acceptance date: 2025-08-27
• DOI: 10.3390/photonics12090868
• EISSN: 2304-6732
• Language: English
• Keywords: pseudo-edge; linear retardance; beam drift; Mueller matrix; polarimetry