Field ion microscopy and 3-D atom probe analysis of Al3Zr particles in 7050 Al alloy.

Journal article

Field ion microscope images have been used to measure the local evaporation field of a Al3Zr particle in 7050 Al alloy. Using the matrix Al evaporation field (19 V/nm) as a reference, the evaporation field of Al3Zr has been estimated to be 36 V/nm, similar to the theoretical value for the field evaporation of Al2+ or Zr3+ ions. A strong local magnification effect from the large difference in evaporation fields between the particle and matrix has been found to cause a severe distortion of the apparent particle morphology in a three-dimensional atom probe reconstruction when using parameters based on the Al matrix. Use of the measured evaporation field for Al3Zr has allowed accurate reconstruction of the morphology of the particle. A simple worst-case analysis predicts that trajectory overlaps increase with increasing cross-section of particle, and the calculated overlaps agree well with experimental estimates of approximately 1.4-2.0 nm for variations in the particle cross-section from 7 to 12 nm. The chemical composition of Al3Zr in a 7050 Al alloy has been measured to be 64.8-67.7 at% Al, 23.6-24.8 at% Zr, 6.9-9.1 at% Zn, 0.4-0.7 at% Cu, 0.5-1.2 at% Mg, with a (Al+Zn)/Zr ratio close to 3. Specimen analysis temperatures of either 25 or 80 K show little effect on the measured chemical compositions of the particle.

Authors: Sha, G; Cerezo, A

• Publication status: Published
• Journal: Ultramicroscopy
• Volume: 102
• Issue: 2
• Pages: 151-159
• Publication date: 2005-01-01
• DOI: 10.1016/j.ultramic.2004.09.006
• EISSN: 1879-2723
• ISSN: 0304-3991
• Language: English
• Keywords: Electron Probe Microanalysis; Alloys; Models, Theoretical; Microscopy; Aluminum; Trace Elements