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Direct imaging of rotational stacking faults in few layer graphene

Abstract:

Few layer graphene nanostructures are directiy imaged using aberration corrected high-resolution transmission electron microscopy with an electron accelerating voltage of 80 kV. We observe rotational stacking faults in the HRTEM images of 2-6 layers of graphene sheets, giving rise to Moiré patterns. By filtering in the frequency domain using a Fourier transform, we reconstruct the graphene lattice of each sheet and determine the packing structure and relative orientations of up to six separat...

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Publisher copy:
10.1021/nl8025949

Authors


Warner, JH More by this author
Rümmeli, MH More by this author
Gemming, T More by this author
Büchner, B More by this author
Briggs, GAD More by this author
Journal:
Nano Letters
Volume:
9
Issue:
1
Pages:
102-106
Publication date:
2009-01-05
DOI:
ISSN:
1530-6984
URN:
uuid:10801f9b-d79a-455a-a6be-490a582d54d2
Source identifiers:
178815
Local pid:
pubs:178815
Language:
English

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