Effect of amorphous layers on the interpretation of restored exit waves.

Journal article

The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of <001> SrTiO3 with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, the error in the position measurements is still in the picometer range.

Authors: Van Aert, S; Chang, L; Bals, S; Kirkland, A; Van Tendeloo, G

• Publication status: Published
• Journal: Ultramicroscopy
• Volume: 109
• Issue: 3
• Pages: 237-246
• Publication date: 2009-02-01
• DOI: 10.1016/j.ultramic.2008.10.024
• EISSN: 1879-2723
• ISSN: 0304-3991
• Language: English
• Keywords: Model-based fitting; High-resolution transmission electron microscopy (HRTEM); Exit wave restoration