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Effect of amorphous layers on the interpretation of restored exit waves.

Abstract:

The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of <001> SrTiO3 with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, howev...

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Publication status:
Published

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Authors


Van Aert, S More by this author
Kirkland, AI More by this author
Van Tendeloo, G More by this author
Journal:
Ultramicroscopy
Volume:
109
Issue:
3
Pages:
237-246
Publication date:
2009-02-05
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
URN:
uuid:0f3228ff-ec02-443d-ae72-ca41e12cfc70
Source identifiers:
29463
Local pid:
pubs:29463

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