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SCANNING TUNNELING MICROSCOPY OF NANOINDENTATIONS

Publication status:: Published

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APA Style

Castell, M., & Weihs, T. (1992). SCANNING TUNNELING MICROSCOPY OF NANOINDENTATIONS. 3RD SYMP ON THIN FILMS : STRESSES AND MECHANICAL PROPERTIES, AT THE 1991 FALL MEETING OF THE MATERIALS RESEARCH SOC, 239, 367–370.

MLA Style

Castell, M, and T Weihs. “SCANNING TUNNELING MICROSCOPY OF NANOINDENTATIONS.” 3RD SYMP ON THIN FILMS : STRESSES AND MECHANICAL PROPERTIES, AT THE 1991 FALL MEETING OF THE MATERIALS RESEARCH SOC, vol. 239, 1992, pp. 367–70.

Chicago Style

Castell, M, and T Weihs. 1992. “SCANNING TUNNELING MICROSCOPY OF NANOINDENTATIONS.” In 3RD SYMP ON THIN FILMS : STRESSES AND MECHANICAL PROPERTIES, AT THE 1991 FALL MEETING OF THE MATERIALS RESEARCH SOC, 239:367–70.
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Authors

+ Castell, M More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Weihs, T More by this author

Role:: Author

Journal:: THIN FILMS : STRESS AND MECHANICAL PROPERTIES III More from this journal
Volume:: 239
Pages:: 367-370
Publication date:: 1992-01-01
Event title:: 3RD SYMP ON THIN FILMS : STRESSES AND MECHANICAL PROPERTIES, AT THE 1991 FALL MEETING OF THE MATERIALS RESEARCH SOC
ISBN:: 1558991336

Pubs id:: pubs:7670
UUID:: uuid:0ec56451-cf21-4c50-96b4-c0d59b30f918
Local pid:: pubs:7670
Source identifiers:: 7670
Deposit date:: 2012-12-19
ARK identifier:: ark:/29072/ora_0ec56451cf214c5096b4c0d59b30f918

Terms of use

Copyright date:: 1992

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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