A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation

Journal article

Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in various facilities worldwide. The resolution of the monitor is defined by so-called Point Spread Function (PSF), source distribution generated by a single electron and projected by an optical system onto a screen. In this paper we represent the development of a novel sub-micrometre electron beam profile monitor based on the measurements of the PSF structure. The first experimental results are presented and future plans on the optimization of the monitor are discussed © 2010 IOP Publishing Ltd.

Authors: Aryshev, A; Boogert, S; Howell, D; Karataev, P; Terunuma, N

• Publication status: Published
• Journal: VIII INTERNATIONAL SYMPOSIUM ON RADIATION FROM RELATIVISTIC ELECTRONS IN PERIODIC STRUCTURES (RREPS-2009)
• Volume: 236
• Pages: 012008-012008
• Publication date: 2010-01-01
• DOI: 10.1088/1742-6596/236/1/012008
• EISSN: 1742-6596
• ISSN: 1742-6588
• Language: English