Room-temperature photoluminescence mediated by sulfur vacancies in 2D molybdenum disulfide

Journal article

Atomic defects in monolayer transition metal dichalcogenides (TMDs) such as chalcogen vacancies significantly affect their properties. In this work, we provide a reproducible and facile strategy to rationally induce chalcogen vacancies in monolayer MoS₂ by annealing at 600 °C in an argon/hydrogen (95%/5%) atmosphere. Synchrotron X-ray photoelectron spectroscopy shows that a Mo 3d_5/2 core peak at 230.1 eV emerges in the annealed MoS₂ associated with nonstoichiometric MoS_x (0 < x < 2), and Raman spectroscopy shows an enhancement of the ∼380 cm^–1 peak that is attributed to sulfur vacancies. At sulfur vacancy densities of ∼1.8 × 10¹⁴ cm^–2, we observe a defect peak at ∼1.72 eV (referred to as LX_D) at room temperature in the photoluminescence (PL) spectrum. The LX_D peak is attributed to excitons trapped at defect-induced in-gap states and is typically observed only at low temperatures (≤77 K). Time-resolved PL measurements reveal that the lifetime of defect-mediated LX_D emission is longer than that of band edge excitons, both at room and low temperatures (∼2.44 ns at 8 K). The LX_D peak can be suppressed by annealing the defective MoS₂ in sulfur vapor, which indicates that it is possible to passivate the vacancies. Our results provide insights into how excitonic and defect-mediated PL emissions in MoS₂ are influenced by sulfur vacancies at room and low temperatures.

Authors: Zhu, Y; Lim, J; Zhang, Z; Wang, Y; Sarkar, S

• Publication status: Published
• Peer review status: Peer reviewed
• Publisher: American Chemical Society
• Journal: ACS Nano
• Volume: 17
• Issue: 14
• Pages: 13545–13553
• Publication date: 2023-07-07
• Acceptance date: 2023-07-03
• DOI: 10.1021/acsnano.3c02103
• EISSN: 1936-086X
• ISSN: 1936-0851
• Language: English
• Keywords: sulfur vacancy generation; room-temperature defect-mediated emission; sulfur vacancy passivation; long-lived localized exciton; FFR; monolayer molybdenum disulfide