Automated Test Pattern Generation for Quantum Circuits

Journal article

This work extends a general method used to test classical circuits to quantum circuits. Gate internal errors are address using a discrete fault model. Fault models to represent unwanted nearest neighbor entanglement as well as unwanted qubit rotation are presented. When witnessed, the faults we model are probabilistic, but there is a set of tests with the highest probability of detecting a discrete repetitive fault. A method of probabilistic set covering to identify the minimal set of tests is introduced. A large part of our work consisted of writing a software package that allows us to compare various fault models and test strategies for quantum networks.

Authors: Biamonte, J; Perkowski, M

• Journal: McNair Research Journal
• Volume: 1
• Issue: 1
• Pages: 10
• Publication date: 2005-01-01
• DOI: 10.1.1.84.7027