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Journal article

Direct detection of electron backscatter diffraction patterns.

Abstract:

We report the first use of direct detection for recording electron backscatter diffraction patterns. We demonstrate the following advantages of direct detection: the resolution in the patterns is such that higher order features are visible; patterns can be recorded at beam energies below those at which conventional detectors usefully operate; high precision in cross-correlation based pattern shift measurements needed for high resolution electron backscatter diffraction strain mapping can be o...

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Publication status:
Published

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Journal:
Physical review letters
Volume:
111
Issue:
6
Pages:
065506
Publication date:
2013-08-05
DOI:
EISSN:
1079-7114
ISSN:
0031-9007
URN:
uuid:0d3cb4d2-3f99-4dc6-b702-41f00c6d8440
Source identifiers:
418940
Local pid:
pubs:418940
Language:
English

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