Accurate structure determination from image reconstruction in ADF STEM

Conference item

Abstract:: Annular dark-field (ADF) imaging in a scanning transmission electron microscope results in direct structure images of the atomic configuration of the specimen. Since such images are almost perfectly incoherent they can be treated as a convolution between a point-spread function, which is simply the intensity of the illuminating electron probe, and a sharply peaked object function that represents the projected structure of the specimen. Knowledge of the object function for an image region of p...
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Institution:

University of Oxford

Division:

MPLS

Department:

Materials

Role:

Author

Role:

Author

Journal:: JOURNAL OF MICROSCOPY-OXFORD
Volume:: 190
Issue:: 1-2
Pages:: 159-170
Publication date:: 1998-01-01
Event title:: International Workshop on Image Analysis Methods in Quantitative TEM
DOI:: 10.1046/j.1365-2818.1998.3260881.x
EISSN:: 1365-2818
ISSN:: 0022-2720

Keywords:: ADF

STEM

structure determination

image reconstruction

probe reconstruction

incoherent imaging
Pubs id:: pubs:14402
UUID:: uuid:0c434b5c-5f23-42b9-ae7d-89bdb61074bd
Local pid:: pubs:14402
Source identifiers:: 14402
Deposit date:: 2012-12-19

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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