Conference item
Structural quantification of nanoparticles by HAADF STEM
- Abstract:
-
A new method of quantifying the HAADF STEM signal on absolute scale, building on the z-contrast nature of the technique, has been developed to address the problem of characterising nanoparticles to an atomic scale. Experimental images are scaled to a fraction of the incident beam intensity from a detector map. The integrated intensity of each individual atomic column is multiplied by the pixel area yielding a more imaging-parameter robust quantity, termed a scattering cross-section. Using thi...
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- Publication status:
- Published
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Bibliographic Details
- Publisher:
- Institute of Physics Publishing
- Host title:
- ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2013 (EMAG2013)
- Volume:
- 522
- Issue:
- 1
- Pages:
- 012061-012061
- Publication date:
- 2014-01-01
- DOI:
- EISSN:
-
1742-6596
- ISSN:
-
1742-6588
Item Description
- Pubs id:
-
pubs:474130
- UUID:
-
uuid:0c210cda-b33c-42f9-ae1a-c980c064538e
- Local pid:
- pubs:474130
- Source identifiers:
-
474130
- Deposit date:
- 2014-07-11
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- Copyright date:
- 2014
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