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Structural quantification of nanoparticles by HAADF STEM

Abstract:

A new method of quantifying the HAADF STEM signal on absolute scale, building on the z-contrast nature of the technique, has been developed to address the problem of characterising nanoparticles to an atomic scale. Experimental images are scaled to a fraction of the incident beam intensity from a detector map. The integrated intensity of each individual atomic column is multiplied by the pixel area yielding a more imaging-parameter robust quantity, termed a scattering cross-section. Using thi...

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Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Publisher:
Institute of Physics Publishing
Host title:
ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2013 (EMAG2013)
Volume:
522
Issue:
1
Pages:
012061-012061
Publication date:
2014-01-01
DOI:
EISSN:
1742-6596
ISSN:
1742-6588
Pubs id:
pubs:474130
UUID:
uuid:0c210cda-b33c-42f9-ae1a-c980c064538e
Local pid:
pubs:474130
Source identifiers:
474130
Deposit date:
2014-07-11

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