Journal article
ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON
- Publication status:
- Published
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- Publisher copy:
- 10.1080/01418619308219357
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Bibliographic Details
- Journal:
- PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES
- Volume:
- 68
- Issue:
- 1
- Pages:
- 59-80
- Publication date:
- 1993-07-05
- DOI:
- EISSN:
-
1460-6992
- ISSN:
-
0141-8610
- URN:
-
uuid:0b7a43f8-dfe0-475e-951a-d0d35215b285
- Source identifiers:
-
27800
- Local pid:
- pubs:27800
Terms of use
- Copyright date:
- 1993
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