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Microstructural characterization of transparent silicon oxide permeation barrier coatings on PET

Abstract:

The aim of this study was to correlate the microstructure and gas barrier performance of nanocomposite films. A range of SiOx layers of varying thickness (13 to 316 nm), deposited by electron beam evaporation on polyethylene terephthalate substrates, have been investigated. The gas barrier properties of the films have been measured for several gases, namely He, Ne, Ar and O. A variety of techniques have been used to microstructurally characterize the oxide coating. It was found that the barri...

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Authors


Roberts, AP More by this author
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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Sutton, AP More by this author
Briggs, GAD More by this author
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Publisher:
Soc of Vacuum Coaters
Journal:
Proceedings, Annual Technical Conference - Society of Vacuum Coaters
Pages:
434-439
Publication date:
1998
ISSN:
0737-5921
URN:
uuid:0aec62c5-853e-4d74-9028-bea109d88345
Source identifiers:
410837
Local pid:
pubs:410837
Language:
English

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