Book section
Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
- Publication status:
- Published
- Peer review status:
- Peer reviewed
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Access Document
- Publisher copy:
- 10.1007/978-3-540-85156-1
Authors
- Publisher:
- Springer Berlin Heidelberg
- Host title:
- EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany. Instrumentation and Methods
- Volume:
- 1
- Pages:
- 39-40
- Publication date:
- 2008-01-01
- DOI:
- ISBN:
- 9783540851561
- Language:
-
English
- Keywords:
- Subjects:
- UUID:
-
uuid:09d0101f-26b8-4bf5-a138-fb3243365776
- Local pid:
-
ora:3453
- Deposit date:
-
2010-03-04
- ARK identifier:
Terms of use
- Copyright holder:
- Springer- Verlag Berlin Heidelberg
- Copyright date:
- 2008
- Notes:
- The full-text of this book chapter is not available in ORA, but the final publication is available at www.springerlink.com (which you may be able to access it via the publisher copy link on this record page).
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