Conference item
Critical current measurements at electric fields in the pV m(-1) regime
- Abstract:
- We describe a technique for characterising sample lengths of commercial superconducting wire in closed loop configuration. This enables the measurement of critical current, as a function of applied magnetic field, at electric field criteria in the range 10(6) to 1 pV m(-1) by detecting the decay of current in the closed loop. How these measurements relate to the more traditional 4 terminal measurements made on short sample coils is discussed and representative data from both NbTi and Nb3Sn samples are presented and analysed.
- Publication status:
- Published
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- Publisher copy:
- 10.1109/77.620846
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Bibliographic Details
- Journal:
- IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
- Volume:
- 7
- Issue:
- 2
- Pages:
- 1455-1458
- Publication date:
- 1997-06-01
- Event title:
- 1996 Applied Superconductivity Conference
- DOI:
- ISSN:
-
1051-8223
- Source identifiers:
-
9316
Item Description
- Pubs id:
-
pubs:9316
- UUID:
-
uuid:0916ce7b-d9c1-446c-b570-f6bbd1be2f88
- Local pid:
- pubs:9316
- Deposit date:
- 2012-12-19
Terms of use
- Copyright date:
- 1997
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