Conference item icon

Conference item

Critical current measurements at electric fields in the pV m(-1) regime

Abstract:
We describe a technique for characterising sample lengths of commercial superconducting wire in closed loop configuration. This enables the measurement of critical current, as a function of applied magnetic field, at electric field criteria in the range 10(6) to 1 pV m(-1) by detecting the decay of current in the closed loop. How these measurements relate to the more traditional 4 terminal measurements made on short sample coils is discussed and representative data from both NbTi and Nb3Sn samples are presented and analysed.
Publication status:
Published

Actions


Access Document


Publisher copy:
10.1109/77.620846

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Condensed Matter Physics
Role:
Author
Journal:
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
Volume:
7
Issue:
2
Pages:
1455-1458
Publication date:
1997-06-01
Event title:
1996 Applied Superconductivity Conference
DOI:
ISSN:
1051-8223
Source identifiers:
9316
Pubs id:
pubs:9316
UUID:
uuid:0916ce7b-d9c1-446c-b570-f6bbd1be2f88
Local pid:
pubs:9316
Deposit date:
2012-12-19

Terms of use


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP