Journal article icon

Journal article

Spatial resolution in atom probe tomography.

Abstract:

This article addresses gaps in definitions and a lack of standard measurement techniques to assess the spatial resolution in atom probe tomography. This resolution is known to be anisotropic, being better in-depth than laterally. Generally the presence of atomic planes in the tomographic reconstruction is considered as being a sufficient proof of the quality of the spatial resolution of the instrument. Based on advanced spatial distribution maps, an analysis methodology that interrogates the ...

Expand abstract
Publication status:
Published

Actions


Access Document


Publisher copy:
10.1017/s1431927609991267

Authors


More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
De Geuser, F More by this author
La Fontaine, A More by this author
Stephenson, LT More by this author
Expand authors...
Journal:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Volume:
16
Issue:
1
Pages:
99-110
Publication date:
2010-02-05
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
URN:
uuid:0831e98c-bb7d-4f0d-a875-94fc46e6f1e4
Source identifiers:
359583
Local pid:
pubs:359583

Terms of use


Metrics



If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP