Journal article
What may visualization processes optimize?
- Abstract:
- In this paper, we present an abstract model of visualization and inference processes, and describe an information-theoretic measure for optimizing such processes. In order to obtain such an abstraction, we first examined six classes of workflows in data analysis and visualization, and identified four levels of typical visualization components, namely disseminative, observational, analytical and model-developmental visualization. We noticed a common phenomenon at different levels of visualization, that is, the transformation of data spaces (referred to as alphabets) usually corresponds to the reduction of maximal entropy along a workflow. Based on this observation, we establish an information-theoretic measure of cost-benefit ratio that may be used as a cost function for optimizing a data visualization process. To demonstrate the validity of this measure, we examined a number of successful visualization processes in the literature, and showed that the information-theoretic measure can mathematically explain the advantages of such processes over possible alternatives.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
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- Files:
-
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(Preview, Accepted manuscript, pdf, 2.9MB, Terms of use)
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- Publisher copy:
- 10.1109/TVCG.2015.2513410
Authors
- Publisher:
- Institute of Electrical and Electronics Engineers
- Journal:
- IEEE Transactions on Visualization and Computer Graphics More from this journal
- Volume:
- 22
- Issue:
- 12
- Pages:
- 2619-2632
- Publication date:
- 2015-12-30
- Acceptance date:
- 2015-12-21
- DOI:
- EISSN:
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1941-0506
- ISSN:
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1077-2626
- Language:
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English
- Keywords:
- Pubs id:
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pubs:580920
- UUID:
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uuid:079c5d7b-c7ef-4dc8-8c4d-53764058c0b7
- Local pid:
-
pubs:580920
- Source identifiers:
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580920
- Deposit date:
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2015-12-29
- ARK identifier:
Terms of use
- Copyright holder:
- IEEE
- Copyright date:
- 2015
- Notes:
- © 2015 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. This is the accepted manuscript version of the article. The final version is available online from Institute of Electrical and Electronics Engineers at: 10.1109/TVCG.2015.2513410
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