Resonance-Amplified Terahertz Near-Field Spectroscopy of a Single Nanowire

Journal article

Nanoscale material systems are central to next-generation optoelectronic and quantum technologies, yet their development remains hindered by limited characterization tools, particularly at terahertz (THz) frequencies. Far-field THz spectroscopy techniques lack the sensitivity for investigating individual nanoscale systems, whereas in near-field THz nanoscopy, surface states, disorder, and sample-tip interactions often mask the response of the entire nanoscale system. Here, we present a THz resonance-amplified near-field spectroscopy technique that can detect subtle conductivity changes in isolated nanoscale systemssuch as a single InAs nanowireunder ultrafast photoexcitation. By exploiting the spatial localization and resonant field enhancement in the gap of a bowtie antenna, our approach enables precise measurements of the nanostructures through shifts in the antenna resonant frequency, offering a direct means of extracting the system response, and unlocking investigations of ultrafast charge-carrier dynamics in isolated nanoscale and microscale systems.

Authors: Norman, S; Chu, G; Peng, K; Seddon, J; Hale, LL

• Publication status: Published
• Peer review status: Peer reviewed
• Publisher: American Chemical Society
• Journal: Nano Letters
• Volume: 24
• Issue: 49
• Pages: 15716-15723
• Publication date: 2024-11-26
• Acceptance date: 2024-11-19
• DOI: 10.1021/acs.nanolett.4c04395
• EISSN: 1530-6992
• ISSN: 1530-6984
• Language: English
• Keywords: Nanowires; Terahertz spectroscopy; Ultrafast dynamics; Near-field microscopy