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Atom probe trajectory mapping using experimental tip shape measurements.

Abstract:

Atom probe tomography is an accurate analytical and imaging technique which can reconstruct the complex structure and composition of a specimen in three dimensions. Despite providing locally high spatial resolution, atom probe tomography suffers from global distortions due to a complex projection function between the specimen and detector which is different for each experiment and can change during a single run. To aid characterization of this projection function, this work demonstrates a met...

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Publication status:
Published

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Authors


Petersen, T More by this author
Ringer, SP More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Journal:
Journal of microscopy
Volume:
244
Issue:
2
Pages:
170-180
Publication date:
2011-11-05
DOI:
EISSN:
1365-2818
ISSN:
0022-2720
URN:
uuid:074f82be-e40f-4dd4-a9de-55d4602f74b1
Source identifiers:
193043
Local pid:
pubs:193043
Language:
English
Keywords:

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