Journal article
The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials
- Abstract:
-
The atomic lensing model has been proposed as a promising method facilitating atom-counting in heterogeneous nanocrystals [1]. Here, image simulations will validate the model, which describes dynamical diffraction as a superposition of individual atoms focussing the incident electrons. It will be demonstrated that the model is reliable in the annular dark field regime for crystals having columns containing dozens of atoms. By using the principles of statistical detection theory, it will be sh...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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- Publisher copy:
- 10.1016/j.ultramic.2018.12.004
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Authors
Bibliographic Details
- Publisher:
- Elsevier Publisher's website
- Journal:
- Ultramicroscopy Journal website
- Volume:
- 203
- Pages:
- 155-162
- Publication date:
- 2018-12-06
- Acceptance date:
- 2018-12-05
- DOI:
- EISSN:
-
1879-2723
- ISSN:
-
0304-3991
- Pmid:
-
30541675
- Source identifiers:
-
952867
Item Description
- Language:
- English
- Keywords:
- Pubs id:
-
pubs:952867
- UUID:
-
uuid:06f0a087-43b9-4169-986e-dbbdba618b0d
- Local pid:
- pubs:952867
- Deposit date:
- 2019-01-25
Terms of use
- Copyright holder:
- Elsevier BV
- Copyright date:
- 2018
- Notes:
- © 2018 Elsevier B.V. All rights reserved.
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