Neutron texture analysis on GEM at ISIS

Conference item

Texture analysis by time-of-flight neutron diffraction, carried out on a multidetector instrument, requires just a few sample orientations. Moreover, on a diffractometer like GEM at ISIS with sufficiently high detector coverage a quantitative bulk texture analysis can be performed even on a stationary sample in a matter of minutes. A 'single-shot', rapid texture measurement on a high-count-rate instrument can be of considerable benefit for studying materials at non-ambient conditions or for bulky samples that cannot be mounted on a goniometer. The capabilities of GEM for texture analysis are demonstrated with results on copper texture standards, which were studied to accompany diffraction analyses of archaeological objects. © 2006 Elsevier B.V. All rights reserved.

Authors: Kockelmann, W; Chapon, L; Radaelli, P

• Publication status: Published
• Host title: PHYSICA B-CONDENSED MATTER
• Volume: 385
• Pages: 639-643
• Publication date: 2006-11-15
• DOI: 10.1016/j.physb.2006.06.091
• ISSN: 0921-4526
• Keywords: texture analysis; TOF neutron diffraction; archaeometry