Journal article icon

Journal article

High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.

Abstract:

In this paper, we demonstrate that the shift between similar features in two electron backscatter diffraction (EBSD) patterns can be measured using cross-correlation based methods to +/- 0.05 pixels. For a scintillator screen positioned to capture the usual large solid angle employed in EBSD orientation mapping this shift corresponds to only approximately 8.5 x 10(-5)rad at the pattern centre. For wide-angled EBSD patterns, the variation in the entire strain and rotation tensor can be determi...

Expand abstract
Publication status:
Published

Actions


Access Document


Journal:
Ultramicroscopy More from this journal
Volume:
106
Issue:
4-5
Pages:
307-313
Publication date:
2006-03-01
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
Language:
English
Keywords:
Pubs id:
pubs:20890
UUID:
uuid:0654537a-52c1-4bf0-9813-12e99e9e33c4
Local pid:
pubs:20890
Source identifiers:
20890
Deposit date:
2012-12-19

Terms of use


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP