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Direct observations of defect structures in optoelectronic materials by Z-contrast stem

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APA Style

Xin, Y., Browning, N., Pennycook, S., Nellist, P., Chen, Y., Rujirawat, S., Sivananthan, S., Omnes, F., Beaumont, B., Faurie, J., & Gibart, P. (1998). Direct observations of defect structures in optoelectronic materials by Z-contrast stem. 14th International Congress on Electron Microscopy, 427–428.

MLA Style

Xin, Y, et al. “Direct Observations of Defect Structures in Optoelectronic Materials by Z-Contrast Stem.” 14th International Congress on Electron Microscopy, 1998, pp. 427–28.

Chicago Style

Xin, Y, N Browning, S Pennycook, P Nellist, Y Chen, S Rujirawat, S Sivananthan, et al. 1998. “Direct Observations of Defect Structures in Optoelectronic Materials by Z-Contrast Stem.” In 14th International Congress on Electron Microscopy, 427–28.
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Authors

+ Xin, Y More by this author

Role:: Author

+ Browning, N More by this author

Role:: Author

+ Pennycook, S More by this author

Role:: Author

+ Nellist, P More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Chen, Y More by this author

Role:: Author

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Journal:: ELECTRON MICROSCOPY 1998, VOL 3 More from this journal
Pages:: 427-428
Publication date:: 1998-01-01
Event title:: 14th International Congress on Electron Microscopy
ISBN:: 0750305665

Pubs id:: pubs:4489
UUID:: uuid:05a0a0b5-7264-497c-af17-ab75b376574b
Local pid:: pubs:4489
Source identifiers:: 4489
Deposit date:: 2012-12-19
ARK identifier:: ark:/29072/ora_05a0a0b57264497caf17ab75b376574b

Terms of use

Copyright date:: 1998

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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