Probing deformation substructure by synchrotron X-ray diffraction and dislocation dynamics modelling.

Journal article

Materials characterization at the nano-scale is motivated by the desire to resolve the structural aspects and deformation behavior at length scales relevant to those mechanisms that define the novel and unusual properties of nano-structured materials. A range of novel techniques has recently become accessible with the help of synchrotron X-ray beams that can be focused down to spot sizes of less than a few microns on the sample. The unique combination of tunability (energy selection), paralle...

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Authors: Korsunsky, A; Hofmann, F; Song, X; Eve, S; Collins, S

• Publication status: Published
• Journal: Journal of nanoscience and nanotechnology
• Volume: 10
• Issue: 9
• Pages: 5935-5950
• Publication date: 2010-09-01
• DOI: 10.1166/jnn.2010.2558
• EISSN: 1533-4899
• ISSN: 1533-4880
• Language: English
• Keywords: Diffraction; Dislocations; Deformation; Reciprocal Space Mapping