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Journal article : Letter

Direct mapping of local Seebeck coefficient in 2D material nanostructures via scanning thermal gate microscopy

Abstract:

Studying local variations in the Seebeck coefficient of materials is important for understanding and optimizing their thermoelectric properties, yet most thermoelectric measurements are global over a whole device or material, thus overlooking spatial divergences in the signal and the role of local variation and internal structure. Such variations can be caused by local defects, metallic contacts or interfaces that often substantially influence thermoelectric properties, especially in two dime...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1088/2053-1583/aba333

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
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Institution:
University of Oxford
Department:
MATERIALS
Sub department:
Materials
Role:
Author
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Name:
Engineering & Physical Sciences Research Council
Grant:
EP/N017188/1
Publisher:
IOP Publishing
Journal:
2D Materials More from this journal
Volume:
7
Issue:
4
Article number:
41004
Publication date:
2020-08-17
Acceptance date:
2020-07-06
DOI:
EISSN:
2053-1583
Language:
English
Keywords:
Subtype:
Letter
Pubs id:
1132203
Local pid:
pubs:1132203
Deposit date:
2021-02-16

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