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Journal article

Recording low and high spatial frequencies in exit wave reconstructions.

Abstract:: Aberration corrected Transmission Electron Microscope (TEM) images can currently resolve information at significantly better than 0.1 nm. Aberration corrected imaging conditions seek to optimize the transfer of high-resolution information but in doing so they prevent the transfer of low spatial frequency information. To recover low spatial frequency information, aberration corrected images must be acquired at a large defocus which compromises high spatial frequency information transfer. In th...
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APA Style

Haigh, S., Jiang, B., Alloyeau, D., Kisielowski, C., & Kirkland, A. (2013). Recording low and high spatial frequencies in exit wave reconstructions. Ultramicroscopy, 133, 26–34.

MLA Style

Haigh, S., et al. “Recording Low and High Spatial Frequencies in Exit Wave Reconstructions.” Ultramicroscopy, vol. 133, 2013, pp. 26–34.

Chicago Style

Haigh, S, B Jiang, D Alloyeau, C Kisielowski, and A Kirkland. 2013. “Recording Low and High Spatial Frequencies in Exit Wave Reconstructions.” Ultramicroscopy 133: 26–34.
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Publisher copy:: 10.1016/j.ultramic.2013.04.012

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+ Haigh, S More by this author

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+ Jiang, B More by this author

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+ Alloyeau, D More by this author

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+ Kisielowski, C More by this author

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+ Kirkland, A More by this author

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Bibliographic Details

Journal:: Ultramicroscopy
Volume:: 133
Pages:: 26-34
Publication date:: 2013-10-01
DOI:: 10.1016/j.ultramic.2013.04.012
EISSN:: 1879-2723
ISSN:: 0304-3991

Item Description

Language:: English
Keywords:: Image Processing, Computer-Assisted

Microscopy, Electron, Transmission
Pubs id:: pubs:410005
UUID:: uuid:0523a435-a37d-4996-a204-ae3c6348f942
Local pid:: pubs:410005
Source identifiers:: 410005
Deposit date:: 2013-11-17

Terms of use

Copyright date:: 2013

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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