The application of polarized neutron reflection (PNR) to the study of the magnetic properties of thin films and multilayers is described. It is demonstrated that PNR provides a means of directly determining the magnetization-vector profile in multilayers of known layer thickness and layer density. Thus, the magnetization reversal process in these systems can be directly studied. A matrix method is presented which can be used to calculate the spin-dependent reflectivity from a multilayer with ...Expand abstract
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Polarized neutron reflection as a probe of magnetic films and multilayers.
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