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Polarized neutron reflection as a probe of magnetic films and multilayers.

Abstract:

The application of polarized neutron reflection (PNR) to the study of the magnetic properties of thin films and multilayers is described. It is demonstrated that PNR provides a means of directly determining the magnetization-vector profile in multilayers of known layer thickness and layer density. Thus, the magnetization reversal process in these systems can be directly studied. A matrix method is presented which can be used to calculate the spin-dependent reflectivity from a multilayer with ...

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Publication status:
Published

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Publisher copy:
10.1103/physrevb.46.3391

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Institution:
University of Oxford
Department:
Oxford, MPLS, Physics, Condensed Matter Physics
Journal:
Physical review. B, Condensed matter
Volume:
46
Issue:
6
Pages:
3391-3400
Publication date:
1992-08-05
DOI:
EISSN:
1095-3795
ISSN:
0163-1829
URN:
uuid:04250505-5003-4f38-99a2-3e0f2596e878
Source identifiers:
27751
Local pid:
pubs:27751
Language:
English

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