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High resolution imaging using the Oxford aberration corrected TEM

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APA Style

Hetherington, C., Kirkland, A., Doole, R., Cockayne, D., Titchmarsh, J., & Hutchison, J. (2006). High resolution imaging using the Oxford aberration corrected TEM. Microscopy and Microanalysis, 12(SUPPL. 2), 1454–1455.

MLA Style

Hetherington, C, et al. “High Resolution Imaging Using the Oxford Aberration Corrected TEM.” Microscopy and Microanalysis, vol. 12, no. SUPPL. 2, 2006, pp. 1454–55.

Chicago Style

Hetherington, C, A Kirkland, R Doole, D Cockayne, J Titchmarsh, and J Hutchison. 2006. “High Resolution Imaging Using the Oxford Aberration Corrected TEM.” Microscopy and Microanalysis 12 (SUPPL. 2): 1454–55.
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Publisher copy:: 10.1017/S1431927606065093

Authors

+ Hetherington, C More by this author

Role:: Author

+ Kirkland, A More by this author

Role:: Author

+ Doole, R More by this author

Role:: Author

+ Cockayne, D More by this author

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+ Titchmarsh, J More by this author

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Journal:: Microscopy and Microanalysis More from this journal
Volume:: 12
Issue:: SUPPL. 2
Pages:: 1454-1455
Publication date:: 2006-08-01
DOI:: 10.1017/S1431927606065093
EISSN:: 1435-8115
ISSN:: 1431-9276

Language:: English
Pubs id:: pubs:285893
UUID:: uuid:0400d1c9-b37f-41b0-8ef3-615a3b0ccd99
Local pid:: pubs:285893
Source identifiers:: 285893
Deposit date:: 2013-11-17
ARK identifier:: ark:/29072/ora_0400d1c9b37f41b08ef3615a3b0ccd99

Terms of use

Copyright date:: 2006

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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