Journal article
Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
- Abstract:
-
The review and comparison of the operation of aberration corrected instruments in the CTEM and STEM configurations is discussed. Electron optical correctors provide significant control over many other aberrations and introduce certain higher-order aberrations along with correction of the spherical aberration. The image aberration is defined as the differential of the wave aberration function, which is calculated as the distance between the aberrated and ideal wave surfaces in the diffraction ...
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Bibliographic Details
- Journal:
- Advances in Imaging and Electron Physics
- Volume:
- 153
- Pages:
- 283-325
- Publication date:
- 2008-01-01
- DOI:
- ISSN:
-
1076-5670
Item Description
- Language:
- English
- Pubs id:
-
pubs:382923
- UUID:
-
uuid:031165e0-e856-4bbb-998f-69571d864f74
- Local pid:
- pubs:382923
- Source identifiers:
-
382923
- Deposit date:
- 2013-11-17
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- Copyright date:
- 2008
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