Journal article
Transmission ion channeling analysis of isolated 60 degrees misfit dislocations
- Abstract:
- High-contrast transmission channeling images and linescans of isolated bunches and individual 60° misfit dislocations in thick partially relaxed Si1-x Gex Si layers are presented. Changes in dislocation contrast with tilt angle are explained using a model of planar dechanneling by the two-edge components of 60° dislocations. By careful analysis of the tilting contrast, all of the four possible combinations of the two-edge components of the Burger's vector of 60° dislocations may be distinguished. © 2005 American Institute of Physics.
- Publication status:
- Published
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- Publisher copy:
- 10.1063/1.2135393
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Authors
Bibliographic Details
- Journal:
- APPLIED PHYSICS LETTERS
- Volume:
- 87
- Issue:
- 21
- Pages:
- 1-3
- Publication date:
- 2005-11-21
- DOI:
- ISSN:
-
0003-6951
- URN:
-
uuid:02cb78a5-752c-414b-9e1d-02a23e634dca
- Source identifiers:
-
19598
- Local pid:
- pubs:19598
Item Description
- Language:
- English
Terms of use
- Copyright date:
- 2005
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