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Transmission ion channeling analysis of isolated 60 degrees misfit dislocations

Abstract:
High-contrast transmission channeling images and linescans of isolated bunches and individual 60° misfit dislocations in thick partially relaxed Si1-x Gex Si layers are presented. Changes in dislocation contrast with tilt angle are explained using a model of planar dechanneling by the two-edge components of 60° dislocations. By careful analysis of the tilting contrast, all of the four possible combinations of the two-edge components of the Burger's vector of 60° dislocations may be distinguished. © 2005 American Institute of Physics.
Publication status:
Published

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Publisher copy:
10.1063/1.2135393

Authors


Breese, MBH More by this author
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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Journal:
APPLIED PHYSICS LETTERS
Volume:
87
Issue:
21
Pages:
1-3
Publication date:
2005-11-21
DOI:
ISSN:
0003-6951
URN:
uuid:02cb78a5-752c-414b-9e1d-02a23e634dca
Source identifiers:
19598
Local pid:
pubs:19598
Language:
English

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