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Strain measurement using electron back scatter diffraction

Publication status:: Published

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APA Style

Wilkinson, A. (1998). Strain measurement using electron back scatter diffraction. 14th International Congress on Electron Microscopy, 731–732.

MLA Style

Wilkinson, A. “Strain Measurement Using Electron Back Scatter Diffraction.” 14th International Congress on Electron Microscopy, 1998, pp. 731–32.

Chicago Style

Wilkinson, A. 1998. “Strain Measurement Using Electron Back Scatter Diffraction.” In 14th International Congress on Electron Microscopy, 731–32.
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Authors

+ Wilkinson, A More by this author

Role:: Author

Journal:: ELECTRON MICROSCOPY 1998, VOL 3 More from this journal
Pages:: 731-732
Publication date:: 1998-01-01
Event title:: 14th International Congress on Electron Microscopy
ISBN:: 0750305665

Pubs id:: pubs:26984
UUID:: uuid:02ba5215-31fe-4a2b-88db-8aa2984735c0
Local pid:: pubs:26984
Source identifiers:: 26984
Deposit date:: 2012-12-19
ARK identifier:: ark:/29072/ora_02ba521531fe4a2b88db8aa2984735c0

Terms of use

Copyright date:: 1998

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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