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Conference item

Strain measurement using electron back scatter diffraction

Publication status:
Published

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Journal:
ELECTRON MICROSCOPY 1998, VOL 3
Pages:
731-732
Publication date:
1998-01-01
Event title:
14th International Congress on Electron Microscopy
Source identifiers:
26984
ISBN:
0750305665
Pubs id:
pubs:26984
UUID:
uuid:02ba5215-31fe-4a2b-88db-8aa2984735c0
Local pid:
pubs:26984
Deposit date:
2012-12-19

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