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A review of the electrical properties of semiconductor nanowires: Insights gained from terahertz conductivity spectroscopy

Abstract:

Accurately measuring and controlling the electrical properties of semiconductor nanowires is of paramount importance in the development of novel nanowire-based devices. In light of this, terahertz conductivity spectroscopy has emerged as an ideal non-contact technique for probing nanowire electrical conductivity and is showing tremendous value in the targeted development of nanowire devices. THz spectroscopic measurements of nanowires enable charge carrier lifetimes, mobilities, dopant concen...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Publisher's version

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Publisher copy:
10.1088/0268-1242/31/10/103003

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Department:
Oxford, MPLS, Physics, Condensed Matter Physics
More by this author
Department:
Oxford, MPLS, Physics, Condensed Matter Physics
More by this author
Department:
Oxford, MPLS, Physics, Condensed Matter Physics
Engineering and Physical Sciences Research Council More from this funder
Royal Commission for the Exhibition of 1851 More from this funder
Publisher:
Institute of Physics Publisher's website
Journal:
Semiconductor Science and Technology Journal website
Volume:
31
Issue:
10
Publication date:
2016-09-05
Acceptance date:
2016-07-13
DOI:
ISSN:
1361-6641 and 0268-1242
Pubs id:
pubs:655310
URN:
uri:01c50bd0-1803-451d-826b-52afe7bd2fbd
UUID:
uuid:01c50bd0-1803-451d-826b-52afe7bd2fbd
Local pid:
pubs:655310

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