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The benefits of energy-filtering in weak-beam microscopy

Abstract:

We have explored systematically the benefits of energy filtering to remove inelastically-scattered electrons with energy losses greater than about 10 eV from weak-beam images of dislocations. Digital weak-beam images were obtained of long dislocations in Ni3Ga using a Gatan Imaging Filter attached to a Jeol 3000F FEGTEM. The image quality was assessed in terms of three parameters: the image peak width; the peak-to-background ratio; and the signal-to-noise ratio. All three of these measures we...

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Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Martin, SP More by this author
Hetherington, CJD More by this author
Pages:
13-24
Publication date:
2003
URN:
uuid:013d8101-4e62-46af-834d-28838210e674
Source identifiers:
19250
Local pid:
pubs:19250
ISBN:
0-87339-535-2

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