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Resonant inelastic x-ray scattering in warm-dense Fe compounds beyond the SASE FEL resolution limit

Abstract:
Resonant inelastic x-ray scattering (RIXS) is a widely used spectroscopic technique, providing access to the electronic structure and dynamics of atoms, molecules, and solids. However, RIXS requires a narrow bandwidth x-ray probe to achieve high spectral resolution. The challenges in delivering an energetic monochromated beam from an x-ray free electron laser (XFEL) thus limit its use in few-shot experiments, including for the study of high energy density systems. Here we demonstrate that by correlating the measurements of the self-amplified spontaneous emission (SASE) spectrum of an XFEL with the RIXS signal, using a dynamic kernel deconvolution with a neural surrogate, we can achieve electronic structure resolutions substantially higher than those normally afforded by the bandwidth of the incoming x-ray beam. We further show how this technique allows us to discriminate between the valence structures of Fe and Fe2O3, and provides access to temperature measurements as well as M-shell binding energies estimates in warm-dense Fe compounds.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1038/s42005-024-01752-0

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Oxford college:
Jesus College
Role:
Author
ORCID:
0000-0002-2872-7223
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Atomic & Laser Physics
Role:
Author


Publisher:
Springer Nature
Journal:
Communications Physics More from this journal
Volume:
7
Issue:
1
Article number:
266
Publication date:
2024-08-06
Acceptance date:
2024-07-18
DOI:
EISSN:
2399-3650


Language:
English
Pubs id:
2018297
Local pid:
pubs:2018297
Deposit date:
2024-07-26

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