Journal article icon

Journal article

Confocal operation of a transmission electron microscope with two aberration correctors

Abstract:

The authors demonstrate that confocal imaging trajectories can be established in a transmission electron microscope fitted with two spherical aberration correctors. An atomic-scale electron beam, focused by aberration-corrected illumination optics, is directly imaged by a second aberration-corrected system. The initial experiment described indicates how aberration-corrected scanning confocal electron microscopy will allow three-dimensional imaging and analysis of materials with atomic lateral...

Expand abstract
Publication status:
Published

Actions


Access Document


Publisher copy:
10.1063/1.2356699

Authors


More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
Journal:
APPLIED PHYSICS LETTERS
Volume:
89
Issue:
12
Pages:
124105-124105
Publication date:
2006-09-18
DOI:
ISSN:
0003-6951
URN:
uuid:0090aab8-40b4-4903-8111-ad22922db3e5
Source identifiers:
22110
Local pid:
pubs:22110
Language:
English

Terms of use


Metrics


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP