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Microscopy of Metal Oxide Surfaces.

Abstract:

Elevated temperature scanning tunneling microscopy is used to study oxides that are room temperature insulators but become sufficiently electrically conducting at higher temperatures to allow imaging to be performed. Atomic resolution images of NiO, CoO, and UO(2) have been obtained in this fashion which allow surface structure and defect determination. To complement the experiments, modeling of the electronic surface structure reveals which atomic sites give rise to the contrast observed in ...

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Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
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Journal:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Volume:
6
Issue:
4
Pages:
324-328
Publication date:
2000-07-05
EISSN:
1435-8115
ISSN:
1431-9276
URN:
uuid:003ec69b-63a1-4913-8217-9854539061e6
Source identifiers:
22143
Local pid:
pubs:22143

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