Journal article

OptaDOS - a new tool for EELS calculations

Abstract:: Many modern (Scanning) Transmission Electron Microscopes ((S)TEMs) are equipped with an energy loss spectrometer. The Electron Energy Loss (EEL) spectra collected provide an experimental method of probing the bonding within a material. With the extra addition of monochromators, the energy resolution obtainable means that even more information is revealed within the fine structure of the spectra. Interpreting the fine structure can often be aided by simulation. Density-functional theory (DFT) ...
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Publication status:: Published

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APA Style

Nicholls, R., Morris, A., Pickard, C., & Yates, J. R. (2012). OptaDOS - a new tool for EELS calculations. ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2011 (EMAG 2011), 371, 012062–012062.

MLA Style

Nicholls, R., et al. “OptaDOS - a New Tool for EELS Calculations.” ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2011 (EMAG 2011), vol. 371, 2012, pp. 012062–62.

Chicago Style

Nicholls, R, A Morris, C Pickard, and JR Yates. 2012. “OptaDOS - a New Tool for EELS Calculations.” ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2011 (EMAG 2011) 371: 012062–62.
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Publisher copy:: 10.1088/1742-6596/371/1/012062

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+ Nicholls, R More by this author

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+ Morris, A More by this author

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+ Pickard, C More by this author

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+ Yates, JR More by this author

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Bibliographic Details

Journal:: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2011 (EMAG 2011) More from this journal
Volume:: 371
Pages:: 012062-012062
Publication date:: 2012-01-01
DOI:: 10.1088/1742-6596/371/1/012062
EISSN:: 1742-6596
ISSN:: 1742-6588

Item Description

Language:: English
Pubs id:: pubs:351074
UUID:: uuid:ff6bfb10-3d7a-4cfc-9fee-669e4c028e00
Local pid:: pubs:351074
Source identifiers:: 351074
Deposit date:: 2013-11-17

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Copyright date:: 2012

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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