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Journal article

OptaDOS - a new tool for EELS calculations

Abstract:

Many modern (Scanning) Transmission Electron Microscopes ((S)TEMs) are equipped with an energy loss spectrometer. The Electron Energy Loss (EEL) spectra collected provide an experimental method of probing the bonding within a material. With the extra addition of monochromators, the energy resolution obtainable means that even more information is revealed within the fine structure of the spectra. Interpreting the fine structure can often be aided by simulation. Density-functional theory (DFT) ...

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Publication status:
Published

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Journal:
ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2011 (EMAG 2011)
Volume:
371
Pages:
012062-012062
Publication date:
2012-01-01
DOI:
EISSN:
1742-6596
ISSN:
1742-6588
URN:
uuid:ff6bfb10-3d7a-4cfc-9fee-669e4c028e00
Source identifiers:
351074
Local pid:
pubs:351074
Language:
English

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