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Automated atom-by-atom three-dimensional (3D) reconstruction of field ion microscopy data

Abstract:

An automated procedure has been developed for the reconstruction of field ion microscopy (FIM) data that maintains its atomistic nature. FIM characterizes individual atoms on the specimen's surface, evolving subject to field evaporation, in a series of two-dimensional (2D) images. Its unique spatial resolution enables direct imaging of crystal defects as small as single vacancies. To fully exploit FIM's potential, automated analysis tools are required. The reconstruction algorithm developed h...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Accepted manuscript

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Publisher copy:
10.1017/S1431927617000277

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Department:
Oxford, MPLS, Materials
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Department:
Oxford, MPLS, Materials
More by this author
Department:
Oxford, MPLS, Materials
More by this author
Department:
Oxford, MPLS, Materials
More by this author
Department:
Trinity College
Publisher:
Cambridge University Press Publisher's website
Journal:
Microscopy and Microanalysis Journal website
Volume:
23
Issue:
2
Pages:
255-268
Publication date:
2017-03-20
Acceptance date:
2017-01-24
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
Pubs id:
pubs:686844
URN:
uri:fec26bd8-34a9-4e58-8e5b-f7e76342f46f
UUID:
uuid:fec26bd8-34a9-4e58-8e5b-f7e76342f46f
Local pid:
pubs:686844

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