Journal article icon

Journal article

Automated atom-by-atom three-dimensional (3D) reconstruction of field ion microscopy data

Abstract:

An automated procedure has been developed for the reconstruction of field ion microscopy (FIM) data that maintains its atomistic nature. FIM characterizes individual atoms on the specimen's surface, evolving subject to field evaporation, in a series of two-dimensional (2D) images. Its unique spatial resolution enables direct imaging of crystal defects as small as single vacancies. To fully exploit FIM's potential, automated analysis tools are required. The reconstruction algorithm developed h...

Expand abstract
Publication status:
Published
Peer review status:
Peer reviewed

Actions


Access Document


Files:
Publisher copy:
10.1017/S1431927617000277

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Oxford college:
Trinity College
Role:
Author
More from this funder
Name:
Engineering and Physical Sciences Research Council
Grant:
EP/H018921/1
Publisher:
Cambridge University Press
Journal:
Microscopy and Microanalysis More from this journal
Volume:
23
Issue:
2
Pages:
255-268
Publication date:
2017-03-20
Acceptance date:
2017-01-24
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
Language:
English
Keywords:
Pubs id:
pubs:686844
UUID:
uuid:fec26bd8-34a9-4e58-8e5b-f7e76342f46f
Local pid:
pubs:686844
Source identifiers:
686844
Deposit date:
2017-03-30

Terms of use


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP