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High-pressure x-ray scattering and computer simulation studies of density-induced polyamorphism in silicon

Abstract:

A low- to high-density pressure-driven phase transition in amorphous silicon is investigated by synchrotron x-ray diffraction in the diamond anvil cell. Complementary atomistic molecular dynamics computer simulations provide insight into the underlying structural transformations and allow us to interpret the structure factors obtained from experiment. During compression the form of the scattering function S (Q) changes abruptly at 13.5 GPa, indicating significant structural rearrangement in t...

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Publication status:
Published

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Publisher copy:
10.1103/PhysRevB.75.224118

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Institution:
University of Oxford
Department:
Oxford, MPLS, Chemistry, Physical and Theoretical Chem
Role:
Author
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Journal:
PHYSICAL REVIEW B
Volume:
75
Issue:
22
Publication date:
2007-06-05
DOI:
EISSN:
1550-235X
ISSN:
1098-0121
URN:
uuid:fe1be112-d7f8-49cb-953e-77bbe0ab809f
Source identifiers:
60103
Local pid:
pubs:60103
Language:
English

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