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Quantum metrology with imperfect states and detectors

Abstract:

Quantum enhancements of precision in metrology can be compromised by system imperfections. These may be mitigated by appropriate optimization of the input state to render it robust, at the expense of making the state difficult to prepare. In this paper, we identify the major sources of imperfection of an optical sensor: input state preparation inefficiency, sensor losses, and detector inefficiency. The second of these has received much attention; we show that it is the least damaging to surpa...

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Publisher copy:
10.1103/PhysRevA.83.063836

Authors


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Institution:
University of Oxford
Department:
Oxford, MPLS, Physics
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Physics
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Physics, Atomic and Laser Physics
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Journal:
Physical Review A - Atomic, Molecular, and Optical Physics
Volume:
83
Issue:
6
Publication date:
2011-06-24
DOI:
EISSN:
1094-1622
ISSN:
1050-2947
URN:
uuid:fdee374c-431e-4c07-8c7f-a5a4183a0e21
Source identifiers:
179302
Local pid:
pubs:179302
Language:
English

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