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Three-dimensional atomic scale analysis of interfaces

Abstract:

The 3-dimensional atom probe (3DAP) permits analysis of the elemental distributions within a small volume of material, typically 20x20x100nm, with near atomic-resolution. This technique has been used to study segregation to grain boundaries in electrodeposited nanocrystalline nickel and Ni-P. To study boundaries in coarse grained material, selected area specimen preparation methods are essential. Focussed ion-beam milling has been used to prepare specimens from interstitial free steels, permi...

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Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
ELECTRON MICROSCOPY AND ANALYSIS 1999 More from this journal
Issue:
161
Pages:
29-34
Publication date:
1999-01-01
Event title:
Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute of Physics (EMAG 99)
ISSN:
0951-3248
ISBN:
0750305770
Keywords:
Pubs id:
pubs:28965
UUID:
uuid:fceadf74-7326-4df6-aebb-ef3bf9d35716
Local pid:
pubs:28965
Source identifiers:
28965
Deposit date:
2012-12-19

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