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Soft x-ray photoelectron spectroscopy of tin-phthalocyanine/GaAs(001)-1 x 6 interface formation

Abstract:

The surface sensitivity of soft x-ray photoelectron spectroscopy is exploited to probe the structural, electronic and chemical properties of an organic/inorganic semiconductor interface. Thin films of tin-phthalocyanine (SnPc) are deposited on a GaAs(001)-1 × 6 surface, prepared by argon ion bombardment. Core level photoemission spectra are analysed to follow the evolution of the interface with SnPc coverage. The results indicate that the interface is largely chemically inert, while the overl...

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Publication status:
Published

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Publisher copy:
10.1088/0953-8984/15/38/012

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Journal:
JOURNAL OF PHYSICS-CONDENSED MATTER
Volume:
15
Issue:
38
Pages:
S2741-S2748
Publication date:
2003-10-01
DOI:
EISSN:
1361-648X
ISSN:
0953-8984
URN:
uuid:fc747376-2544-46c8-8871-777785cb4200
Source identifiers:
252313
Local pid:
pubs:252313
Language:
English

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